Anuraag Sharma

Graduating: Summer 2026 (B.Eng., Microelectronics)
Focus: PhD programs in physics / materials / computational science

This CV is deliberately incomplete without the rest of the site.

How I reason about models: /method
Where inference broke in practice: /constraints
Projects as failure cases, not success stories: /case-studies
Crossing borders and topics led me: /elsewhere

Contact

Email: anuraag.sharma22 [at] student.xjtlu.edu.cn
Phone: +1 (518) 937-2183
Status: U.S. Permanent Resident
Location: Taicang, China → TBD Fall 2026

Education

Xi’an Jiaotong–Liverpool University
B.Eng., Microelectronic Science and Engineering
Expected Summer 2026 (Direct Year 2 Entry)

University of Liverpool
B.Eng. (Hons), Microelectronic Science and Engineering
(Double Degree Program)

Note: My formal training is engineering-heavy. Most physics depth came from research-driven self-study prompted by model failures rather than coursework.

Research Experience

AlN electroabsorption under bias

XJTLU — School of CHIPS
Advisor: Assoc. Prof. Jangyong Kim | 2024–present

Studied field-dependent UV transmission in PEALD AlN thin films.
Tested crystalline electro-optic and free-carrier mechanisms against structural and spectral constraints.
Those mechanisms could not be supported by available data.
Defect-mediated electroabsorption remained consistent but not uniquely identifiable.
First project where I explicitly documented what the data could not determine.

Optical transitions in doped g-C₃N₄

XJTLU — Chemistry & Materials Science
Advisor: Prof. Heechae Choi | 2024–present

Computed dielectric response and optical transitions using DFT.
Initially relied on single relaxed geometries; this proved insufficient.
Transition energies and selection rules depended strongly on local configuration.
Shifted to small-ensemble sampling after observing unstable optical conclusions.

Industry Experience

Inverse optical metrology

KLA Corporation — Applications Engineering Intern
Summer 2025

Built an inverse RCWA pipeline mapping broadband reflectance to trench geometry.
Found trench depth to be reliably constrained; secondary parameters were not.
Reduced measurement time by narrowing the admissible parameter space rather than increasing model complexity.
Reinforced that identifiability matters more than model sophistication.

Publications

S. Ji, H-Y. Ahn, M. Dreger, A. Sharma, et al.
Mixing Anions in Metal Chalcogenides for Effective Band Gap Engineering with Temperature
ACS Applied Optical Materials 2(8), 1559–1565 (2024)
A. Sharma, W. Chen, A. Kandwal, C. C. Kit, J. Kim
Electric Field-Induced Optical Effects in AlN Thin Films for Transparent Electronic Interfaces
Scientific Reports — submitted (2026)

Tools & Methods (compressed)

Electronic structure: VASP (PBE, occasional HSE06)
Inverse modeling: RCWA
Computation: Slurm-based HPC clusters
Analysis: Python (NumPy, SciPy, ASE, Pandas, Matplotlib)
Characterization: XRD, SEM, AFM, IV–CV (primarily for exclusion, not confirmation)

Languages: English, Hindi; Chinese (HSK-4); French (intermediate)

Last updated: January 2026